class Roughness_Stack_BRDF_Model


The class Roughness_Stack_BRDF_Model implements the solution to first-order vector perturbation theory for roughness in the smooth surface limit of a single interface of a dielectric stack as described by Elson. It inherits the properties of Roughness_BRDF_Model.

Parameters:

Parameter Data Type Description Default
lambda double Wavelength of the light in vacuum [µm].
(Inherited from BRDF_Model).
0.532
type int Indicates whether scattering is evaluated in reflection (0) or transmission (1).
(Inherited from BRDF_Model).
0
substrate dielectric_function The optical constants of the substrate, expressed as a complex number (n,k) or, optionally, as a function of wavelength.
(Inherited from BRDF_Model).
(4.05,0.05)
psd PSD_Function_Ptr The two-dimensional power spectrum of the surface height function [µm4].
(Inherited from Roughness_BRDF_Model).
ABC_PSD_Function
stack dielectric_stack Description of the stack of films deposited on the substrate, usually specified by a file.
See dielectric_stack, for more information.
no films
this_layer int Index of the rough interface, where (0) is the most buried interface, (1) is the next most buried interface, etc. This model assumes that none of the other interfaces is rough. 0

See also:

SCATMECH Home,   Conventions,   BRDF_Model,   Roughness_BRDF_Model,   dielectric_stack

J. M. Elson, "Multilayer-coated optics: guided-wave coupling and scattering by means of interface random roughness," J. Opt. Soc. Am. A 12(4), 729 (1995).

Include file:

#include "roughnes.h"

Source code:

roughnes.cpp

Definition of public elements:

class Roughness_Stack_BRDF_Model :
   public Roughness_BRDF_Model
{
};

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Current SCATMECH version: 6.00 (February 2008)
This page first online: Version 2.00 (March 2001)
This page last modified: Version 6.00 (February 2008)