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NIST Technical Note 1438 contains the following papers:
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G. Eppeldauer and J.E. Hardis
"Fourteen-decade photocurrent measurements with large-area silicon photodiodes at room temperature," (2.62 MB) PDF Applied Optics, 30(22), 3091-3099 (1991).


G. Eppeldauer
"Temperature Monitored/Controlled Silicon Photodiodes for Standardization," (646 KB) PDF SPIE Proceedings, 1479, 71-77 (1991).


G.P. Eppeldauer
"Chopped Radiation Measurement With Large Area Si Photodiodes," (1.33 MB) PDF J. Res. Natl. Inst. Stands. Technol. 103(2), 153-162 (1998).


G. Eppelauer
"Noise-optimized silicon radiometers," (1.43 MB) PDF J. Res. Natl. Inst. Stands. Technol. 105(209), 209-219 (2000).


G. P. Eppeldauer and D. C. Lynch
"Opto-mechanical and electronic design of a tunnel-trap Si-radiometer," (2.30 MB) PDF to be published in the J. Res. Natl. Inst. Stand. Technol.


G. Eppeldauer
"Electronic characteristics of Ge and InGaAs radiometers," (563 KB) PDF SPIE Proceedings 3061-97, 833-838 (1997).


G. P. Eppeldauer, A.L. Migdall, and L. M. Hanssen
InSb Working Standard Radiometers," (781 KB) PDF Metrologia, 35, 485-490, 1998.


J. Lehman, G. Eppeldauer, J. A. Aust, and M. Racz
Domain-engineered pyroelectric radiometer," (1.35 MB) PDF Appl. Opt. 38(34), 7047-7055 (1999).


G. Eppeldauer, A. L. Migdall, and C. L. Cromer
"A cryogenic silicon resistance bolometer for use as an infrared transfer standard detector," (733 KB) PDF in Thermal Phenomena at Molecular and in Cryogenic Infrared Detectors, M. Kaviany, D.A. Kaminski, A. Majumdar, P.E. Phelan, M.M. Yovanovich, and Z.M. Zhang, Eds., book H00908-1994 (American Society of Mechanical Engineers, New York, 1994), pp. 63-67.


G. Eppeldauer and L. Novak
"Linear HgCdTe radiometer," (636 KB) PDF SPIE Proceedings, 1110, 267-273 (1989).


G. P. Eppeldauer and R. J. Martin
"Photocurrent measurement of PC and PV HgCdTe detectors," (1.47 MB) PDF to be published in the J. Res. Natl. Inst. Stands. Technol.
To obtain your free CD of TN 1438, Optical Radiation Measurement with Selected Detectors and Matched Electronic Circuits Between 200 nm and 20 µm, contact:
George Eppeldauer
National Institute of Standards and Technology
100 Bureau Drive, MS 8442
Gaithersburg, MD 20899-8442
301-975-2338
301-869-5700 (fax)
george.eppeldauer@nist.gov

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Online: July 2002