NIST Technical Note 1438 contains the following papers:
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- G. Eppeldauer and J.E. Hardis
- "Fourteen-decade photocurrent measurements
with large-area silicon photodiodes at room temperature,"
(2.62 MB)
Applied Optics, 30(22), 3091-3099
(1991).
- G. Eppeldauer
- "Temperature Monitored/Controlled Silicon
Photodiodes for Standardization,"
(646 KB)
SPIE Proceedings, 1479, 71-77 (1991).
- G.P. Eppeldauer
- "Chopped Radiation Measurement With Large Area
Si Photodiodes,"
(1.33 MB)
J. Res. Natl. Inst. Stands. Technol. 103(2),
153-162 (1998).
- G. Eppelauer
- "Noise-optimized silicon radiometers,"
(1.43 MB)
J. Res. Natl. Inst. Stands. Technol. 105(209),
209-219 (2000).
- G. P. Eppeldauer and D. C. Lynch
- "Opto-mechanical and electronic design of a
tunnel-trap Si-radiometer,"
(2.30 MB)
to be published in the J. Res. Natl. Inst. Stand.
Technol.
- G. Eppeldauer
- "Electronic characteristics of Ge and InGaAs
radiometers,"
(563 KB)
SPIE Proceedings 3061-97, 833-838
(1997).
- G. P. Eppeldauer, A.L. Migdall, and L. M. Hanssen
- InSb Working Standard Radiometers,"
(781 KB)
Metrologia, 35, 485-490, 1998.
- J. Lehman, G. Eppeldauer, J. A. Aust, and M. Racz
- Domain-engineered pyroelectric radiometer,"
(1.35 MB)
Appl. Opt. 38(34), 7047-7055 (1999).
- G. Eppeldauer, A. L. Migdall, and C. L. Cromer
- "A cryogenic silicon resistance bolometer for
use as an infrared transfer standard detector,"
(733 KB)
in Thermal Phenomena at Molecular and in Cryogenic
Infrared Detectors, M. Kaviany, D.A. Kaminski, A. Majumdar,
P.E. Phelan, M.M. Yovanovich, and Z.M. Zhang, Eds.,
book H00908-1994 (American Society of Mechanical Engineers, New York, 1994),
pp. 63-67.
- G. Eppeldauer and L. Novak
- "Linear HgCdTe radiometer,"
(636 KB)
SPIE Proceedings, 1110, 267-273
(1989).
- G. P. Eppeldauer and R. J. Martin
- "Photocurrent measurement of PC and PV HgCdTe
detectors,"
(1.47 MB)
to be published in the J. Res. Natl. Inst. Stands.
Technol.
To obtain your free CD of TN 1438, Optical Radiation Measurement with
Selected Detectors and Matched Electronic Circuits Between 200 nm and
20 µm, contact:
George Eppeldauer
National Institute of Standards and Technology
100 Bureau Drive, MS 8442
Gaithersburg, MD 20899-8442
301-975-2338
301-869-5700 (fax)
george.eppeldauer@nist.gov
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