TECHNICAL ACTIVITIES 1999 - NISTIR 6438

X-Ray Spectroscopy of Highly Charged Ions. Electrons bound deep in the cores of atoms are exposed by stripping away the outer electrons and excited by electron impact at the NIST Electron Beam Ion Trap (EBIT) facility. The excited core electrons emit x-ray radiation, which is measured using classical diffraction techniques (crystal spectrometers), solid state detectors, and microcalorimeters. Expertise from across several disciplines and research groups are combined to form an ideal testing ground for descriptions of the atomic structure of matter. The logo depicts a recent experiment in which a crystal spectrometer (lower left) on a Roland circle diffracts x-rays emitted by a single electron deeply bound in the Coulomb potential (right) of hydrogenic vanadium ions.

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Online: April 2000