ATOMIC PHYSICS DIVISION (Gaithersburg, MD) Carl J. Williams, Chief Tel 301 975 3201 Fax 301 975 3038

The Atomic Physics Division carries out a broad program of long-term experimental and theoretical research in atomic physics, ranging from hot, highly-charged ions to ultracold atoms and including the determination of their radiative and collisional properties. It studies the physics of laser cooling and the electromagnetic trapping of neutral atoms and highly charged ions, generates Bose Einstein condensates and is engaged in research directed at improving and applying x-ray measurement technology. In pursuit of its mission and in support of emerging technologies and industrial needs, the Division provides measurements, standards and reference data for such areas as materials processing, thin-film characterization, advanced lighting, and medical x-ray analysis. The division contributes to advances in fundamental standards on atomic clocks, on the Si kg and on the unification of the electromagnetic scale. Finally, it develops new methods for the analysis of plasmas by their spectral radiation, and it critically evaluates and compiles atomic spectroscopy data in response to diverse needs of various user communities.

Major programs

• Investigate laser cooling and trapping of atoms

• Generate robust Bose Einstein condensates, explore their properties and develop atom lasers

• Produce "optical lattices" for ultra-cold atoms and investigate atom optics for innovative instrumentation

• Measure and analyze spectra of highly ionized atoms for fusion energy research, x-ray space observatories, and x-ray lasers

• Investigate nanostructure fabrication with the Electron Beam Ion Trap (EBIT)

• Develop and use sophisticated atomic theory to calculate atomic structure data

• Carry out high-precision laser spectroscopy to determine reference wavelengths and to test basic atomic theory

• Provide an international information center on the fundamental constants and closely related precision measurements

• Analyze the consistency of measured values of the constants in order to test fundamental physical theory and to obtain sets of recommended values of the constants for international use

• Administer the NIST Precision Measurement Grant (PMG) Program

• Serve as the NIST-authorized organization for the interpretation of the International System of Units (SI) in the United States.

• Critically evaluate and compile atomic spectroscopic reference data

• Experimentally and theoretically investigate atomic and molecular collision processes in cold atomic gases

• Develop plasma-spectroscopic measurement techniques pertinent to surface-processing of materials

• Establish the capability to measure linear displacement with atomic scale refinement and accuracy

• Unify the visible, x-ray, and gamma-ray wavelength regions to establish more accurate x-ray and gamma-ray wavelength standards, to provide critical tests of theoretical calculations, and to determine fundamental constants

• Measure and compare highly perfect single crystal lattice periods to characterize materials and to support x-ray and gamma-ray wavelength measurements

• Produce, characterize, and model atomically smooth thin films and multilayers

• Provide support for space astronomy requiring accurate, specialized x-ray calibration systems and high-accuracy atomic spectroscopy data

Collaborations with industry

• Laser-cooled atomic clocks

• Ultraviolet source radiometry, index-of-refraction, stress coefficient and birefringence measurements for the electronics industry

• Atomic data for design of new-generation fluorescent lamps and high-intensity discharges

• Experimental tests of gaseous-discharge models used in microelectronic manufacturing

• High-resolution rare-earth spectra for advanced lighting

• Develop new algorithms used in high-performance computing applications

• X-ray diffraction techniques for characterization of thin films of interest to the semiconductor industry

• X-ray spectroscopy for industrial, medical, and structural applications

• Produce and characterize multilayer optics for synchrotron beamline applications and laboratory x-ray sources

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Online: November 1994   -   Last update: July 2004