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This software system was developed at the National Institute of Standards and
Technology by employees of the Federal Government in the course of their official duties,
pursuant to title 17 Section 105 of the United States Code. Data and descriptions of this software
system are not subject to copyright protection and are in the public domain. This software system is
an experimental system. NIST assumes no responsibility whatsoever for its use by other parties,
and makes no guarantees, expressed or implied, about its quality, reliability, or any other characteristic.
We would appreciate acknowledgement if the software is used. The Acrobat Reader identified on this website does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the Acrobat Reader identified are necessarily the best available for the purpose. Technical Inquiries: Thomas Brian Renegar Surface and Nanostructure Metrology Group Semiconductor and Dimensional Metrology Division Physical Measurement Laboratory NIST, 100 Bureau Drive, Stop 8212 Gaithersburg, MD 20899-8212 NIST | PML | Semiconductor and Dimensional Metrology Division
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