Publications on Photon Cross Sections Bibliographic Database

that include SiO2

Emission and Absorption Spectrum Study of Si and SiO2 Energy Structure in the Regions of Ultrasoft X-Ray Radiation
Ershov, O. A. and Lukirskii, A. P.,
Fiz. Tverd. Tela 8, 2137-2142 (1966): transl. in Sov. Phys. Solid State 8, 1699-1703 (1967)
(0.093-0.193 keV: Si, SiO2)

Comparison of Absorption Coefficients Obtained by Different Methods in the Ultrasoft X-Ray Region
Ershov, O. A.,
Opt. Spectrosk. 22, 468-472 (1967); transl. in Opt. Spectrosc. 22, 252-255 (1967)
(0.0954-1.77 keV: Al, Ti, V, Cr, Au, SiO2, Polystyrene)

Reflection of X Rays from Certain Substances in the Region from 7 to 44 Angstroms
Ershov, 0. A., Brytov, I. A., and Lukirskii, A. P.,
Opt. Spectrosk. 22, 127-134 (1967); transl. in Opt. Spectrosc. (USSR) 22, 66-69 (1967) (Also personal comm. received 8/19/71 from Zimkina, T. M.)
(0.114-1.740 keV: Al, Ti, V, Cr, Ni, Ge, Au, SiO2, Polystyrene)

Experimental X-Ray Mass Attenuation Coefficients for Materials of Low Atomic Number in the Energy Range 4 to 25 keV
Millar, R. H. and Greening, J. R.,
J. Phys. B 7, 2332-2344 (1974)
(4.508-25.192 keV: N, O, Ne, Mg, Al, Ar, C2H4, CO2, CF4, H2S, HCl, Air, SiO2, (C2H5)3·PO4)

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